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New nanopositioning stage for micropositioning Nov 24, 2008

piezosystem jena introduces an XY plane nanopositioning and microscanning stage featuring a wide center clearance. -a clearance of 30x30mm² -motion range of up to 250 µm ol, 200 µm cl

It can be equipped with an integrated high resolution capacitive feedback sensor. Creep and hystersis can be compensated.
The system provides supreme position stability, linearity, repeatability and accuracy. Furthermore, digital amplifiers from piezosystem jena allow optimization of the electrical parameters during system operation for the best performance under the conditions of operation.

Vacuum and cryogenic performances are available on request as well as, body material variations of invar, super invar, aluminum or titanium.

The PXY 201 CAP is an excellent choice for applications such as scanning microscopy, surface analysis, metrology and alignment as well as wide range nanopositioning and micro scanning requirering sub-nm accuracy and free aperture too.

 

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