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Nano-Indentation / Materials Testing w/ Scanning Probe Microscopy / Piezo Stages Jul 18, 2011

A flexible nano-indentation system by Micro Materials Ltd. offers a variety of methods for materials characterization, including nano-indentation, nano-impact and nano-scratch and wear measurements.

The system can measure penetration depths between 0.1 nanometers and 50 microns based on a PISeca capacitive gage by PI. A combined indentation / scanning probe microscope mode based on a piezo scanning stage provides a quick method for assessing the sample surface.

Read Nano-Indenter Technote:

For more information on the NanoTest system visit
For more information on piezo nano-positioning systems


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